The x - ray diffraction data indicate that the cnx film structures are amorphous 在不锈钢片上的cnx薄膜,虽然没有剥落现象。
2.
The cdte films doped te are deposited onto glass substrate by close spaced sublimation . the x - ray diffraction data indicate the pure cdte films are polycrystalline zinc - blende structure with grain orientation predominantly along ( 111 ) direction . the electrical properties of cdte films are investigated by hall effect measurement using the van der pauw method X射线衍射分析表明,纯cdte薄膜是立方闪锌矿结构, ( 111 )晶面取向生长; hall效应实验测量发现薄膜电阻很高,呈p型电导,面电阻率数量级达1010